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A model for failure-time data with two dependent failure modes and prediction of future failures


A model for failure-time data with two dependent failure modes and prediction of future failures

In this article, we present a model for reliability data with two dependent failure modes. Inferential methods for the proposed model are discussed. The efficacy of the methods of inference is assessed through a Monte Carlo simulation study, and it is observed that the model and methods perform satisfactorily. An issue of practical interest for reliability engineers is to predict field failures at a future time. Prediction methods are developed in this setting. For illustrative purposes, analysis of a real dataset on failure of a device is presented. In summary, the model and methods presented in this article provide a comprehensive treatment for analyzing reliability data with two dependent failure modes.

Co-author (s): Aakash Agrawal, Ayon Ganguly

Journal: Quality Engineering

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